Lothar Weinhardt
(Karlsruhe Institute of Technology (KIT))
10/20/25, 2:50 PM
Lothar Weinhardt
(Karlsruhe Institute of Technology (KIT))
RT2
Talk
Material and device development crucially depend on an in-depth characterization of the electronic and chemical properties of the involved materials and their interfaces. Traditionally, (soft) x-ray spec-troscopy techniques are very powerful and well-established tools for probing the electronic and chem-ical structure. Many instrumental advances have been achieved over the last decades, mostly...