Sami Wirtensohn
(Helmholtz-Zentrum Hereon)
10/22/25, 9:30 AM
Thomas van de Kamp
(IPS)
10/22/25, 10:00 AM
Sami Wirtensohn
(Helmholtz-Zentrum Hereon)
RT2
Talk
Dark-field X-ray imaging provides access to sub-resolution structural information by detecting small-angle X-ray scattering instead of attenuation or phase contrast [1]. However, existing implementations, such as grating-based [2] and speckle-based techniques [3], are typically limited to micrometer-scale resolution. Here, we present the first realization of directional dark-field imaging at...